Structural and optical characterization of ZnO thin films used as template for low-E glass

Yarupetan A.U.; Gonzalez J.C. · AIP Conference Proceedings (2023) · DOI: 10.1063/5.0176580

Resumen

A reactive magnetron sputtering technique was used to grow ZnO nanostructured thin films on commercial glass substrates to be used as template for low emissivity glass. The ZnO films had a nominal thickness of 20, 50 and 100 nm to found correlation between structural and optical results. Structural characterization was performed by techniques of X-ray reflectivity, scanning electron microscopy, micro-Raman and photoluminescence spectroscopies to evaluate roughness, microstructure and optical properties, including density and refractive index. The X'Pert reflectivity program was used to fit the reflectivity data. The variation of the density in the structural results were correlated with the variation of the Raman signal at 577 cm-1 which is a consequence of the presence of zinc-rich zones in the nanocolumns. Meanwhile the appearance of the bands at 790 and 811 nm in the photoluminescence spectra is related to the location of Zn nanocrystals in the nanocolumn matrix.

Instituciones: Universidad Nacional Mayor de San Marcos