Digit span WAIS III: test-retest reliability analysis in argentine adults

Martino P.; Cervigni M.; Sponton J.; Murray J.; Gallegos M. · Revista Argentina de Ciencias del Comportamiento (2025) · DOI: 10.32348/1852.4206.v17.n3.40827

Resumen

WAIS III’s Digit Span is a frequently used test in neuropsychological assessment to explore attentional span and working memory. Although the scientific literature has shown a good to excellent test-retest reliability, these studies have focused on the r coefficient, and not on the intraclass correlation coefficient or ICC. The aim was to analyze the test-retest reliability for WAIS III’S Digit span using the ICC. WAIS III’s Digit Span was administered to 85 Argentinian (M 64.1 years, age range: 43-85 years) at two different times, with an average interval of 75.5 days. Digits Backwards and total Digits showed good reliability with ICC=.61. Digits Forward showed fair reliability with ICC=.57. These results suggest that the temporal stability of the test is acceptable, but with values at the limit. Further reliability studies with ICC and shorter intervals would be desirable to ratify or rectify these new findings.

Instituciones: Universidad Continental