A Micromechanical Data-Driven Machine-Learning Approach for Microstructural Characterization of Solder Balls in Electronic Packages Subjected to Thermomechanical Fatigue

Kurniawan R.R.; Sayed B.T.; Sari A.; Luna J.P.; Kareem A.K.; Hussien N.A. · Journal of Electronic Materials (2023) · DOI: 10.1007/s11664-023-10402-0

Resumen

A combination of nanoindentation mapping and machine-earning (ML) modeling has been used to characterize the microstructural changes in SnPb solder balls exposed to thermal cycling. The model facilitated the microstructural evaluation of solder bumps through the prediction of microscale variations of Young’s modulus in the joint zone. The outcomes revealed that the micromechanical data-driven ML model precisely classified the microstructural constituents, i.e., β-Sn and α-Pb, along with the grain boundary (GB) regions. However, some deviations were observed in GB recognition, when the elastic modulus gradient was not sharp enough. The predictive results also revealed that the increase in number of thermal cycles led to stiffening and grain coarsening of α-Pb, while the β-Sn matrix mainly remained stable. Moreover, it was found that the thermal cycling intensified structural heterogeneity in the solder and sharpened the elastic modulus variations at the GB regions. In summary, the outcomes of this study demonstrate the prediction possibility of microstructural features in SnPb solder balls with a predefined thermal cycle numbers, and unfolded the relationship between morphological characteristics and microscale mechanical properties.

Instituciones: Universidad Nacional Mayor de San Marcos